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TECHSPEC® components are designed, specified, or manufactured by Edmund Optics. Learn More

38.1mm Dia. 1064nm, Nd:YAG Laser Line Beam Sampler

TECHSPEC® Nd:YAG Laser Line Beam Samplers

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Angle of Incidence (°):
0 ±5
Clear Aperture (%):
Laser V-Coat (1064nm)
Coating Specification:
Rabs <0.25% @ 1064nm
Design Wavelength DWL (nm):
Diameter (mm):
38.10 +0.00/-0.10
Index of Refraction nd:
Parallelism (arcmin):
Substrate: Many glass manufacturers offer the same material characteristics under different trade names. Learn More
Fused Silica (Corning 7980)
Surface Flatness (P-V):
Surface Quality:
Thickness (mm):
6.35 ±0.20
Beam Sampler
Damage Threshold, By Design: Damage threshold for optical components varies by substrate material and coating. Click here to learn more about this specification.
15 J/cm2 @ 1064nm, 20ns, 20Hz

Regulatory Compliance

RoHS 2015:
Reach 209:
Certificate of Conformance:

Product Family Description

  • Uncoated First Surface Provides Fresnel Reflection
  • High Laser Damage Threshold Coating on One Surface
  • 10-5 Surface Quality

TECHSPEC® Nd:YAG Laser Line Beam Samplers are used to split a small portion of an incident laser beam through Fresnel reflection provided by the uncoated surface for beam monitoring purposes. These beam samplers feature high performance physical properties for minimum effects on the passed through beam, including 10-5 surface quality and λ/10 surface flatness. An anti-reflection coating with a high damage threshold applied on the second surface helps limit ghost reflections. TECHSPEC Nd:YAG Laser Line Beam Samplers are made of UV Fused Silica, providing excellent transmission from the UV to the IR and a low coefficient of thermal expansion. Beam samplers with anti-reflection laser line coatings for 266nm, 355nm, 532nm, and 1064nm wavelengths are available.

Note: TECHSPEC Nd:YAG Laser Line Beam Samplers can be used with Laser Measurement products to monitor beam properties, such as beam power and beam profile, in real time.

Laser Line Beam Sampler
Laser Line Beam Sampler