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Microscopy Targets

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High Resolution Microscopy Slide Targets New
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High Resolution Microscopy Slide Targets
  • Small Pattern Sizes - 100nm and 3300 lp/mm
  • Composed using High-Precision E-Beam Lithography
  • Negative Pattern Design
Concentric Circles Transmission Reticles Concentric Circles Transmission Reticles
  • Designed for 1X Objective Power
  • Concentric Circle Pattern
  • B270 Substrate
Crossed Micrometer Scales Transmission Reticles Crossed Micrometer Scales Transmission Reticles
  • Designed for 1X Objective Power
  • 5 or 10mm Scale
  • 1.5mm Thickness
Crossline Transmission Reticles Crossline Transmission Reticles
  • Designed for 1X Objective Power
  • Crossline Pattern
  • 19 or 21mm Diameter Versions
Horizontal Micrometer Scales Transmission Reticles Horizontal Micrometer Scales Transmission Reticles
  • Designed for 1X Objective Power
  • 1, 5, or 10mm Scale Versions
  • 0.1 or 0.5 Inch Scale Versions
Indexed Grids Transmission Reticles Indexed Grids Transmission Reticles
  • Designed for 1X Objective Power
  • Indexed Grid Pattern
  • 19 or 21mm Diameter Reticles
Net Grid Transmission Reticles Net Grid Transmission Reticles
  • Designed for 1X Objective Power
  • Net Grid Squares over Entire Field
  • 19 or 21mm Diameter Versions
Protractors Transmission Reticles Protractors Transmission Reticles
  • Designed for 1X Objective Power
  • 1 Degree Increments with Every 10 Degrees Labeled
  • Total Pattern Over a 10mm Diameter
Reticle Calibration Stage Micrometer Reticle Calibration Stage Micrometer
  • Features a Series of "H" Shaped Fiducial Images
  • Image Sizes from 0.1 to 20mm
  • Available with NIST Traceable Data
Scaled Transmission Reticles - 21mm Diameter Scaled Transmission Reticles - 21mm Diameter
  • Designs for 1 to 5X Magnification
  • Provide Direct Measurement Capability for Standard Microscopes
  • 21mm Diameter Design
Stage Micrometers Stage Micrometers
  • Reticle Scales Centered on Microscope Slides
  • Designed for Routine Calibration
  • 1 x 3" Slide Sizes

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Microscopy Targets measure the accuracy and performance of a system in imaging and microscopy applications. Microscopy Targets provide measurement capabilities, use a variety of patterns, such as Ronchi or star, to measure a system’s resolution. While most targets are designed for machine vision, Microscopy Targets are truly designed for microscopy measurement needs and applications.

Edmund Optics offers High Resolution Microscopy Targets for distortion. High Resolution Targets are designed for high magnification microscopy systems and are conveniently shaped based off the dimensions of a standard microscope slide. Targets are also available physically mounted in a slide.


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