
- Ideal for High-Precision Material Processing and Laser Scanning Applications
- Large Scan Fields Up to 410mm x 410mm
- High Damage Thresholds and Low Telecentricity Errors
- Galvanometers, Beam Expanders, and Laser Sources Also Available

- Multispectral Design Wavelength of 532nm and 1064nm
- Large Scan Field of 102mm x 102mm and a Focal Length of 163mm
- High Damage Thresholds and Low Telecentricity Errors
- Galvanometers, Beam Expanders, and Laser Sources Also Available

- Fused Silica Optical Elements Reduce Thermal Expansion
- 1.5X, 2.5X, and 3X Fixed Magnification Options Available
- High Damage Thresholds up to 5.0 J/cm² (1ns, 50Hz)

- 1X – 3X and 1X – 8X Variable Magnification
- High Damage Thresholds up to 5.0 J/cm² (1ns, 50Hz)
- Motorized Magnification Versions Available

- Motorized Magnification Adjustment
- From 0.9X to 4X Variable Magnification
- Damage Threshold of 0.3 J/cm² (1ps, 100Hz)

- Designed For 369nm Ion Fluorescence Wavelengths
- High Numerical Aperture and Diffraction Limited Performance
- Ideal for Ytterbium (Yb+) Ion Quantum Computing and Sensing Applications
or view regional numbers
QUOTE TOOL
enter stock numbers to begin
Copyright 2023, Edmund Optics Inc., 101 East Gloucester Pike, Barrington, NJ 08007-1380 USA
California Consumer Privacy Acts (CCPA): Do Not Sell or Share My Personal Information
California Transparency in Supply Chains Act