- Tests Resolutions from 4 to 228 lp/mm
- Ability to tests Multiple Field Points using 9 Targets
- Reduces Testing Time
The USAF pattern wheel is an ideal target to measure resolution at different field points within an imaging system’s field of view. The pattern is available on three different substrate sizes: 1” square, 1.5” diameter, or a 1” x 3” slide. Each size includes 8 USAF patterns in a circular pattern plus one pattern in the center. Each size is offered as positive (opaque pattern on clear background) or negative (clear pattern on opaque background).